Particle-induced background rejection method for the follow-up X-ray telescope onboard Einstein probe
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Hai-Sheng Zhao,
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Xiao-Fan Zhao,
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Ju Guan,
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Juan Zhang,
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Cheng-Kui Li,
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Shu-Mei Jia,
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Yong Chen,
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Jing-Jing Xu,
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Da-Wei Han,
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Li-Ming Song,
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Jin Wang,
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Wei-Wei Cui
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Abstract
Purpose Background removal is an important issue in data reduction for the follow-up X-ray telescope (FXT) onboard the Einstein Probe (EP), particularly for the particle-induced background. They appear in various charge patterns in the focal plane PN-CCD, such as straight tracks, isolated showers and broad rectangular swathes.
Methods We use the data obtained with the FXT mirror assembly covered, which are due to particle-induced background, to study the methods for rejecting such background.
Results The particle-induced background in the FXT comprises background directly caused by particles, as well as instrument events that are also due to particles. A new rejection method, which involves cluster identification, and threshold veto for number of hits in rows and columns, is applied to remove the particle-induced background. The remaining background can be eliminated by the event reconstruction algorithm and event veto in subsequent FXT data reduction.
Conclusion It is shown that their methods can achieve a background rejection efficiency of 99.8 %. Additionally, there has been a notable decrease in the number of spikes in the light curves of the FXT. Furthermore, we found the instrument background is attributed to a combination of particles and CAMEX electronics.
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Hai-Sheng Zhao, Xiao-Fan Zhao, Ju Guan, et al. Particle-induced background rejection method for the follow-up X-ray telescope onboard Einstein probe[J]. Radiation Detection Technology and Methods, 2025, 9(2): 208-214. DOI: 10.1007/s41605-025-00528-6
Citation:
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Hai-Sheng Zhao, Xiao-Fan Zhao, Ju Guan, et al. Particle-induced background rejection method for the follow-up X-ray telescope onboard Einstein probe[J]. Radiation Detection Technology and Methods, 2025, 9(2): 208-214. DOI: 10.1007/s41605-025-00528-6
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Hai-Sheng Zhao, Xiao-Fan Zhao, Ju Guan, et al. Particle-induced background rejection method for the follow-up X-ray telescope onboard Einstein probe[J]. Radiation Detection Technology and Methods, 2025, 9(2): 208-214. DOI: 10.1007/s41605-025-00528-6
Citation:
|
Hai-Sheng Zhao, Xiao-Fan Zhao, Ju Guan, et al. Particle-induced background rejection method for the follow-up X-ray telescope onboard Einstein probe[J]. Radiation Detection Technology and Methods, 2025, 9(2): 208-214. DOI: 10.1007/s41605-025-00528-6
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